Technical Papers

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Analytical Decomposition of System Probability of Survival to Define Part-Level Radiation Test Requirements

Market Area:

Electronic Systems

Date:

-

Author:

D. Larsen, G. Zvonar, B. Lyons, Dr. K. Adams, Dr. S. Bernacki (Retired), R. Miles

Solution-Based Sb2Se3 Thin Films for Microphotonics

Market Area:

Electronic Systems

Date:

-

Author:

Rashi Sharma, Casey Schwarz, Daniel Wiedeman, Eric Bissel, Brian Mills, Marie Sykes, Jasper Stackawitz, Jake Klucinec, Dennis Callahan, JueJun Hu, Parag Banerjee, and Kathleen Richardson

Decentralized Decision Making over Random Graphs

Market Area:

Electronic Systems

Date:

-

Author:

Samuel J. Fedeler, Marcus J. Holzinger, William W. Whitacre